Statistics Metrology Books Categories

Statistics Metrology Categories Books ListStatistics Metrology Books Categories

Multivariate Error Analysis: A Handbook of Error Propagation and Calculations (Hardcover)

Multivariate Error Analysis: A Handbook of Error Propagation and Calculations (Hardcover)

Multivariate Error Analysis: A Handbook of Error Propagation and Calculations (Hardcover)

By: A.A. Clifford

Measurement Systems Analysis (MSA)

Measurement Systems Analysis (MSA)

Measurement Systems Analysis (MSA)

By: AIAG

Measurements and their Uncertainties: A practical guide to modern error analysis (Paperback)

Measurements and their Uncertainties: A practical guide to modern error analysis (Paperback)

Measurements and their Uncertainties: A practical guide to modern error analysis (Paperback)

By: Ifan G. Hughes

Concepts for R&R Studies (Paperback)

Concepts for R&R Studies (Paperback)

Concepts for R&R Studies (Paperback)

By: Larry B. Barrentine

Uncertainty of Measurements: Physical and Chemical Metrology: Impact & Analysis (Paperback)

Uncertainty of Measurements: Physical and Chemical Metrology: Impact & Analysis (Paperback)

Uncertainty of Measurements: Physical and Chemical Metrology: Impact & Analysis (Paperback)

By: Shri Krishna Kimothi

EMP III (Evaluating the Measurement Process): Using Imperfect Data

EMP III (Evaluating the Measurement Process): Using Imperfect Data

EMP III (Evaluating the Measurement Process): Using Imperfect Data

By: Donald J. Wheeler

Design and Analysis of Gauge R and R Studies: Making Decisions with Confidence Intervals in Random and Mixed ANOVA Models (ASA-SIAM Series on Statistics and Applied Probability, Series Number 17)

Design and Analysis of Gauge R and R Studies: Making Decisions with Confidence Intervals in Random and Mixed ANOVA Models (ASA-SIAM Series on Statistics and Applied Probability, Series Number 17)

Design and Analysis of Gauge R and R Studies: Making Decisions with Confidence Intervals in Random and Mixed ANOVA Models (ASA-SIAM Series on Statistics and Applied Probability, Series Number 17)

By: Richard K. Burdick